Advantest Releases E3660 for Next-Gen Semiconductor Testing
Introduction to the E3660 CD-SEM
TOKYO — In an exciting development for the semiconductor industry, Advantest Corporation (TSE: 6857) has unveiled its next-generation Critical Dimension Scanning Electron Microscope (CD-SEM), the E3660. This advanced device is specifically designed for precision metrology of photomasks and EUV masks, which are crucial for the manufacturing of cutting-edge semiconductors. The E3660 offers a remarkable improvement, boasting over a 20% enhancement in critical dimension reproducibility compared to its predecessor, the E3650. This improvement positions device manufacturers to meet the stringent requirements necessary for fabricating at the 2nm technology node and beyond.
The Challenges of Advanced Semiconductor Manufacturing
As the industry strives for continuous scaling down of semiconductor components, the complexity of patterns utilized in devices is increasing. This leads to numerous lithographic hotspots where errors are more likely to occur during the patterning process. The performance of photomasks, which define the circuitry on semiconductors, is evolving remarkably, introducing intricate geometries and higher layer counts. Consequently, this evolution signals a rise in the number of required metrology sites and a pressing demand for measurement systems that provide both high throughput and exceptional reproducibility.
Innovations in Mask Patterns
The shift towards curvilinear mask patterns is anticipated to significantly influence production practices starting around 2027 as High Numerical Aperture EUV lithography comes into play. To maintain high fidelity between design and production, CD-SEMs must deliver accurate critical dimension measurements while producing images that genuinely reflect the design contours. This involves implementing curvature-sensitive algorithms that can detect and quantify deviations in complex mask features from their intended designs.
Collaboration with imac and Development of the E3660
Advantest’s journey to develop the E3660 involved rigorous collaboration with imec, a renowned research hub in nanoelectronics. This partnership played a pivotal role in validating the E3660’s performance against results from both the earlier E3650 model and EDA-based reference measurements, reinforcing the reliability of measurements offered by the E3660. By addressing the unique challenges posed by curvilinear geometries, the E3660 has been optimized for high-throughput measurement, adeptly handling increased site counts while also providing specialized functionalities for measuring curvilinear patterns.
Target Market for the E3660
Initially, Advantest plans to deploy the E3660 across Merchant and Captive Mask Shops. These facilities are essential for producing masks for various customers as well as in-house production for semiconductor manufacturers. This strategic targeting highlights the E3660’s importance as a leading evaluation tool in advanced mask development and production qualification.
About Advantest Corporation
Founded in 1954, Advantest Corporation (TSE: 6857) stands as a leader in manufacturing automatic test and measurement equipment tailored for semiconductor design and production. The company’s technology is integral to numerous applications, including 5G technologies, the Internet of Things (IoT), autonomous vehicles, and artificial intelligence (AI), among others. Advantest’s systems are utilized in the world’s most advanced semiconductor production lines, focusing on R&D to tackle emerging challenges. With a commitment to sustainability and global responsibility, Advantest continues to innovate and expand its offerings for future technological applications.
Frequently Asked Questions
What is the E3660 and its purpose?
The E3660 is Advantest's latest Critical Dimension Scanning Electron Microscope, designed for high-precision dimensional metrology of photomasks and EUV masks used in semiconductor manufacturing.
How does the E3660 improve on its predecessor?
The E3660 provides over a 20% improvement in critical dimension reproducibility compared to the previously released E3650, enhancing overall measurement reliability.
Where will the E3660 be deployed initially?
Advantest intends to deploy the E3660 in Merchant Mask Shops for commercial mask production and Captive Mask Shops used by semiconductor manufacturers for in-house production.
What advancements are expected in semiconductor manufacturing?
The industry is expected to see a shift toward curvilinear mask patterns, greatly enhanced by High Numerical Aperture EUV lithography, shaping future production standards.
How does Advantest contribute to the semiconductor industry?
Advantest provides cutting-edge test and measurement solutions, contributing to advancements in semiconductor technology, including domains like 5G, IoT, and AI.
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