Nova Measuring Instruments Ltd (NVMI) 12.00 $NVMI
Nova Measuring Instruments to Report First Quarter 2015 Results on May 12, 2015
PR Newswire - Wed Apr 15, 7:48AM CDT
Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today announced that it will release its results for the first quarter of 2015 after the NASDAQ market closes on May 12, 2015.
NVMI: 12.00 (+0.39)
Nova Completes the Acquisition of ReVera
PR Newswire - Thu Apr 02, 8:00AM CDT
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today announced it has closed the previously announced acquisition of ReVera Incorporated, a profitable privately held company headquartered in Santa Clara, Calif. The acquisition allows Nova to offer the most innovative and unique metrology portfolio, which combines Optical CD and XPS solutions, to address customers' technology and productivity challenges in the most advanced nodes.
NVMI: 12.00 (+0.39)
Nova Measuring Is Well-Positioned In Light Of Value Chain Integration
Simple Investment Ideas - at Seeking Alpha - Mon Mar 16, 1:01PM CDT
NVMI: 12.00 (+0.39)
ReVera announces it will be acquired by Nova Measuring Instruments Ltd.
PR Newswire - Thu Mar 12, 4:00PM CDT
ReVera Incorporated, the materials metrology company, announces that it will be acquired by Nova Measuring Instruments Ltd. (NASDAQ; NVMI) subject to the terms of a definitive agreement signed today. Nova is a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing. ReVera will be acquired for $46.5 Million in an all cash deal with an expected close date in mid-April, 2015.
NVMI: 12.00 (+0.39)
Nova Measuring buying chip equipment maker for $46.5M
Seeking Alpha - at Seeking Alpha - Wed Mar 11, 6:00PM CDT
NVMI: 12.00 (+0.39)
Nova to Acquire ReVera, Provider of Advanced X-Ray Metrology Solutions, to Strengthen Position in Advanced Process Control Market
PR Newswire - Wed Mar 11, 5:00PM CDT
Conference Call at 10 a.m. ET on March 12, 2015
NVMI: 12.00 (+0.39)
Nova Measuring Instrument: Promising Outlook On Strong Quarterly Results
Simple Investment Ideas - at Seeking Alpha - Fri Feb 20, 10:48AM CST
NVMI: 12.00 (+0.39)
Nova Measuring Instruments' (NVMI) CEO Eitan Oppenhaim on Q4 2014 Results - Earnings Call Transcript
SA Transcripts - at Seeking Alpha - Wed Feb 18, 7:38PM CST
NVMI: 12.00 (+0.39)
Nova Measuring Instruments posts 4Q profit
Automated Insights - Wed Feb 18, 5:48PM CST
REHOVOT, Israel (AP) _ Nova Measuring Instruments Ltd. (NVMI) on Wednesday reported fourth-quarter earnings of $3.3 million.
NVMI: 12.00 (+0.39)
Nova Measuring Instruments beats by $0.04, beats on revenue
Seeking Alpha - at Seeking Alpha - Wed Feb 18, 3:17PM CST
NVMI: 12.00 (+0.39)
Nova Announces Record 2014 Full-Year Results
PR Newswire - Wed Feb 18, 3:01PM CST
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today reported record 2014 full year results.
NVMI: 12.00 (+0.39)
Notable earnings after Wednesday's close
Seeking Alpha - at Seeking Alpha - Tue Feb 17, 4:35PM CST
CYNI: 4.16 (+0.01), TERP: 42.15 (+0.47), MHLD: 14.90 (+0.02), PKD: 4.10 (-0.04), HT: 6.61 (+0.12), SCTY: 59.09 (+1.40), DTLK: 11.95 (+0.36), EOG: 97.70 (+1.11), CAR: 55.86 (-0.09), SNPS: 47.54 (+0.25), THRX: 17.08 (+0.45), RGP: 22.31 (+0.01), OGS: 42.39 (-0.28), NVMI: 12.00 (+0.39), SUN: 51.09 (+0.72), STR: 23.95 (unch), IAG: 2.10 (-0.09), ETE: 64.93 (+0.18), CSLT: 7.85 (+0.36), AVG: 21.57 (unch), LOPE: 44.69 (-0.11), BGS: 29.77 (-0.18), PAAS: 9.12 (-0.33), ASGN: 38.68 (unch), MRO: 30.35 (+0.22), SXL: 42.41 (+0.35), ACT: 295.22 (+0.69), MIC: 84.08 (-0.09), PCYC: 256.98 (-0.77), TI: 11.62 (-0.04), AXLL: 42.83 (-0.58), SBRA: 31.11 (-0.16), ELNK: 4.82 (-0.01), FNF: 37.13 (+0.22), HSTM: 29.05 (-0.15), CVG: 23.04 (+0.09), EQC: 25.76 (-0.15), EXAM: 42.52 (-0.16), ETP: 54.50 (+0.09), OIS: 42.50 (+0.67), BJRI: 50.54 (-1.00), KEG: 2.15 (+0.03), MANT: 32.59 (-0.04), REXX: 4.77 (-0.04), SIX: 49.97 (+1.37), CDE: 5.36 (-0.14), ARII: 52.58 (-0.20), CW: 75.65 (-0.17), ABX: 12.37 (-0.44), LHO: 37.95 (+0.47), IPI: 11.86 (-0.02), MAR: 80.79 (+0.32), DENN: 11.51 (-0.06), ARRS: 30.54 (+0.38), SUNE: 27.27 (+0.56), SSS: 91.21 (+0.29), KEYW: 9.97 (+0.06), AMTG: 16.01 (-0.03)
Global Thin Film Metrology Systems Market 2015-2019 with KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies Dominating
PR Newswire Europe - Tue Feb 17, 10:43AM CST
DUBLIN, Feb .17, 2015 /PRNewswire/ --Research and Markets
RTEC: 11.66 (+0.10), KLAC: 60.30 (+0.96), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
Research and Markets: Global Thin Film Metrology Systems Market 2015-2019: Key Vendors are KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies
Business Wire - Tue Feb 17, 7:46AM CST
Research and Markets (http://www.researchandmarkets.com/research/hzqzvb/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2015-2019" report to their offering.
RTEC: 11.66 (+0.10), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
Global Thin Film Metrology Systems Market 2015-2019: Key Vendors are KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies
M2 - Tue Feb 17, 6:43AM CST
Research and Markets (http://www.researchandmarkets.com/research/5vxtg6/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2015-2019" report to their offering. The Global Thin-film Metrology Systems market will grow at a CAGR of 3.4% over the period 2014-2019 Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis. One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process. According to the report, one of the main drivers of the market is the increased level of complexity in ICs. Over the years, the number of functions an IC has been able to do has increased considerably, resulting in the introduction of complex architectures such as 3D and FinFET. This is expected to foster the demand for thin film metrology systems as they are used in the manufacturing of complex semiconductor ICs. Further, the report states that the cyclical nature of the semiconductor industry is one of the main challenges in the market. The revenue generated in the Semiconductor industry is cyclical in nature which acts as a major challenge for thin film metrology systems as they are dependent on the economic condition and the capital expenditure cycle of semiconductor manufacturers. Often production tends to exceed the demand during economic downturn, resulting in inventory pileup and, thus, low demand for semiconductor devices. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including: - ODMs - OEMs - Foundries Key Vendors - KLA-Tencor - Nanometrics - Nova Measuring Instruments - Rudolph Technologies Other Prominent Vendors - Hitachi High-Technologies - SCREEN Holdings - Semilab Key Topics Covered: - Executive Summary - List of Abbreviations - Scope of the Report - Market Research Methodology - Introduction - Market Landscape - Geographical Segmentation - Buying Criteria - Market Growth Drivers - Drivers and their Impact - Market Challenges - Impact of Drivers and Challenges - Market Trends - Trends and their Impact - Vendor Landscape - Key Vendor Analysis For more information visit http://www.researchandmarkets.com/research/5v..._thin_film
RTEC: 11.66 (+0.10), KLAC: 60.30 (+0.96), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
NOVA Receives First Order for In-Situ Real-Time Profile Measurement Software for Advanced Memory Process
PR Newswire - Tue Feb 17, 4:00AM CST
Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that it has received its first order for Real-time Profile Measurement solution, NovaRPM®, for real-time monitoring of advanced Etch processes.
NVMI: 12.00 (+0.39)
Nova Measuring Instruments Well-Positioned For The Future
Simple Investment Ideas - at Seeking Alpha - Fri Feb 13, 1:35PM CST
NVMI: 12.00 (+0.39)
Camtek (CAMT) Crumbles: Stock Falls by 6.3% - Tale of the Tape
Zacks Equity Research - Zacks Investment Research - Wed Feb 11, 7:45AM CST
Camtek's shares fell 6.3% on the day continuing the volatility
CAMT: 3.67 (+0.08), NVMI: 12.00 (+0.39)
Nova Measuring Instruments to Attend Susquehanna Financial Group's Fourth Annual Semi, Storage & Technology Summit
PR Newswire - Mon Feb 09, 7:12AM CST
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that Mr. Eitan Oppenhaim, President and CEO, will attend the Susquehanna Financial Group's (SFG) Fourth Annual Semi, Storage & Technology Summit on February 24th, 2015.
NVMI: 12.00 (+0.39)
Nova Measuring Instruments to Report First Quarter 2015 Results on May 12, 2015
PR Newswire - Wed Apr 15, 7:48AM CDT
Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today announced that it will release its results for the first quarter of 2015 after the NASDAQ market closes on May 12, 2015.
NVMI: 12.00 (+0.39)
Nova Completes the Acquisition of ReVera
PR Newswire - Thu Apr 02, 8:00AM CDT
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today announced it has closed the previously announced acquisition of ReVera Incorporated, a profitable privately held company headquartered in Santa Clara, Calif. The acquisition allows Nova to offer the most innovative and unique metrology portfolio, which combines Optical CD and XPS solutions, to address customers' technology and productivity challenges in the most advanced nodes.
NVMI: 12.00 (+0.39)
Nova Measuring Is Well-Positioned In Light Of Value Chain Integration
Simple Investment Ideas - at Seeking Alpha - Mon Mar 16, 1:01PM CDT
NVMI: 12.00 (+0.39)
ReVera announces it will be acquired by Nova Measuring Instruments Ltd.
PR Newswire - Thu Mar 12, 4:00PM CDT
ReVera Incorporated, the materials metrology company, announces that it will be acquired by Nova Measuring Instruments Ltd. (NASDAQ; NVMI) subject to the terms of a definitive agreement signed today. Nova is a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing. ReVera will be acquired for $46.5 Million in an all cash deal with an expected close date in mid-April, 2015.
NVMI: 12.00 (+0.39)
Nova Measuring buying chip equipment maker for $46.5M
Seeking Alpha - at Seeking Alpha - Wed Mar 11, 6:00PM CDT
NVMI: 12.00 (+0.39)
Nova to Acquire ReVera, Provider of Advanced X-Ray Metrology Solutions, to Strengthen Position in Advanced Process Control Market
PR Newswire - Wed Mar 11, 5:00PM CDT
Conference Call at 10 a.m. ET on March 12, 2015
NVMI: 12.00 (+0.39)
Nova Measuring Instrument: Promising Outlook On Strong Quarterly Results
Simple Investment Ideas - at Seeking Alpha - Fri Feb 20, 10:48AM CST
NVMI: 12.00 (+0.39)
Nova Measuring Instruments' (NVMI) CEO Eitan Oppenhaim on Q4 2014 Results - Earnings Call Transcript
SA Transcripts - at Seeking Alpha - Wed Feb 18, 7:38PM CST
NVMI: 12.00 (+0.39)
Nova Measuring Instruments posts 4Q profit
Automated Insights - Wed Feb 18, 5:48PM CST
REHOVOT, Israel (AP) _ Nova Measuring Instruments Ltd. (NVMI) on Wednesday reported fourth-quarter earnings of $3.3 million.
NVMI: 12.00 (+0.39)
Nova Measuring Instruments beats by $0.04, beats on revenue
Seeking Alpha - at Seeking Alpha - Wed Feb 18, 3:17PM CST
NVMI: 12.00 (+0.39)
Nova Announces Record 2014 Full-Year Results
PR Newswire - Wed Feb 18, 3:01PM CST
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, today reported record 2014 full year results.
NVMI: 12.00 (+0.39)
Notable earnings after Wednesday's close
Seeking Alpha - at Seeking Alpha - Tue Feb 17, 4:35PM CST
CYNI: 4.16 (+0.01), TERP: 42.15 (+0.47), MHLD: 14.90 (+0.02), PKD: 4.10 (-0.04), HT: 6.61 (+0.12), SCTY: 59.09 (+1.40), DTLK: 11.95 (+0.36), EOG: 97.70 (+1.11), CAR: 55.86 (-0.09), SNPS: 47.54 (+0.25), THRX: 17.08 (+0.45), RGP: 22.31 (+0.01), OGS: 42.39 (-0.28), NVMI: 12.00 (+0.39), SUN: 51.09 (+0.72), STR: 23.95 (unch), IAG: 2.10 (-0.09), ETE: 64.93 (+0.18), CSLT: 7.85 (+0.36), AVG: 21.57 (unch), LOPE: 44.69 (-0.11), BGS: 29.77 (-0.18), PAAS: 9.12 (-0.33), ASGN: 38.68 (unch), MRO: 30.35 (+0.22), SXL: 42.41 (+0.35), ACT: 295.22 (+0.69), MIC: 84.08 (-0.09), PCYC: 256.98 (-0.77), TI: 11.62 (-0.04), AXLL: 42.83 (-0.58), SBRA: 31.11 (-0.16), ELNK: 4.82 (-0.01), FNF: 37.13 (+0.22), HSTM: 29.05 (-0.15), CVG: 23.04 (+0.09), EQC: 25.76 (-0.15), EXAM: 42.52 (-0.16), ETP: 54.50 (+0.09), OIS: 42.50 (+0.67), BJRI: 50.54 (-1.00), KEG: 2.15 (+0.03), MANT: 32.59 (-0.04), REXX: 4.77 (-0.04), SIX: 49.97 (+1.37), CDE: 5.36 (-0.14), ARII: 52.58 (-0.20), CW: 75.65 (-0.17), ABX: 12.37 (-0.44), LHO: 37.95 (+0.47), IPI: 11.86 (-0.02), MAR: 80.79 (+0.32), DENN: 11.51 (-0.06), ARRS: 30.54 (+0.38), SUNE: 27.27 (+0.56), SSS: 91.21 (+0.29), KEYW: 9.97 (+0.06), AMTG: 16.01 (-0.03)
Global Thin Film Metrology Systems Market 2015-2019 with KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies Dominating
PR Newswire Europe - Tue Feb 17, 10:43AM CST
DUBLIN, Feb .17, 2015 /PRNewswire/ --Research and Markets
RTEC: 11.66 (+0.10), KLAC: 60.30 (+0.96), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
Research and Markets: Global Thin Film Metrology Systems Market 2015-2019: Key Vendors are KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies
Business Wire - Tue Feb 17, 7:46AM CST
Research and Markets (http://www.researchandmarkets.com/research/hzqzvb/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2015-2019" report to their offering.
RTEC: 11.66 (+0.10), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
Global Thin Film Metrology Systems Market 2015-2019: Key Vendors are KLA-Tencor, Nanometrics, Nova Measuring Instruments & Rudolph Technologies
M2 - Tue Feb 17, 6:43AM CST
Research and Markets (http://www.researchandmarkets.com/research/5vxtg6/global_thin_film) has announced the addition of the "Global Thin Film Metrology Systems Market 2015-2019" report to their offering. The Global Thin-film Metrology Systems market will grow at a CAGR of 3.4% over the period 2014-2019 Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis. One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process. According to the report, one of the main drivers of the market is the increased level of complexity in ICs. Over the years, the number of functions an IC has been able to do has increased considerably, resulting in the introduction of complex architectures such as 3D and FinFET. This is expected to foster the demand for thin film metrology systems as they are used in the manufacturing of complex semiconductor ICs. Further, the report states that the cyclical nature of the semiconductor industry is one of the main challenges in the market. The revenue generated in the Semiconductor industry is cyclical in nature which acts as a major challenge for thin film metrology systems as they are dependent on the economic condition and the capital expenditure cycle of semiconductor manufacturers. Often production tends to exceed the demand during economic downturn, resulting in inventory pileup and, thus, low demand for semiconductor devices. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including: - ODMs - OEMs - Foundries Key Vendors - KLA-Tencor - Nanometrics - Nova Measuring Instruments - Rudolph Technologies Other Prominent Vendors - Hitachi High-Technologies - SCREEN Holdings - Semilab Key Topics Covered: - Executive Summary - List of Abbreviations - Scope of the Report - Market Research Methodology - Introduction - Market Landscape - Geographical Segmentation - Buying Criteria - Market Growth Drivers - Drivers and their Impact - Market Challenges - Impact of Drivers and Challenges - Market Trends - Trends and their Impact - Vendor Landscape - Key Vendor Analysis For more information visit http://www.researchandmarkets.com/research/5v..._thin_film
RTEC: 11.66 (+0.10), KLAC: 60.30 (+0.96), NVMI: 12.00 (+0.39), NANO: 15.29 (+0.13)
NOVA Receives First Order for In-Situ Real-Time Profile Measurement Software for Advanced Memory Process
PR Newswire - Tue Feb 17, 4:00AM CST
Nova Measuring Instruments (Nasdaq: NVMI), a leading innovator and key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that it has received its first order for Real-time Profile Measurement solution, NovaRPM®, for real-time monitoring of advanced Etch processes.
NVMI: 12.00 (+0.39)
Nova Measuring Instruments Well-Positioned For The Future
Simple Investment Ideas - at Seeking Alpha - Fri Feb 13, 1:35PM CST
NVMI: 12.00 (+0.39)
Camtek (CAMT) Crumbles: Stock Falls by 6.3% - Tale of the Tape
Zacks Equity Research - Zacks Investment Research - Wed Feb 11, 7:45AM CST
Camtek's shares fell 6.3% on the day continuing the volatility
CAMT: 3.67 (+0.08), NVMI: 12.00 (+0.39)
Nova Measuring Instruments to Attend Susquehanna Financial Group's Fourth Annual Semi, Storage & Technology Summit
PR Newswire - Mon Feb 09, 7:12AM CST
Nova Measuring Instruments Ltd. (Nasdaq: NVMI), a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that Mr. Eitan Oppenhaim, President and CEO, will attend the Susquehanna Financial Group's (SFG) Fourth Annual Semi, Storage & Technology Summit on February 24th, 2015.
NVMI: 12.00 (+0.39)
