MPI Corporation Introduces a Groundbreaking 250 GHz Solution
In a brilliant showcase of innovation, MPI Corporation has unveiled an advanced 250 GHz broadband test solution, set to revolutionize semiconductor testing. This solution harmoniously combines the outstanding TITAN™ Probes with MPI's extensive expertise in wafer-level measurements, enhancing precision in testing next-generation semiconductors and sub-terahertz applications.
A New Era for Semiconductor Testing
This latest advancement stems from MPI's rich background in high-frequency measurements. With previous solutions that already expanded the horizons of broadband probing beyond 200 GHz, the new system solidifies MPI's standing as a front-runner in the semiconductor testing space. By collaborating closely with Keysight Technologies, MPI enhances its offerings, integrating state-of-the-art instrumentation with their leading-edge wafer-level solutions for an effective response to the increasing need for sub-terahertz testing.
Pioneering Features of the 250 GHz Solution
Stojan Kanev, General Manager of the Advanced Semiconductor Test (AST) Division at MPI Corporation, highlights the company's historical achievements. He remarked, "MPI was the first to demonstrate live single sweep calibration and wafer-level measurements up to 250 GHz, both single-ended and differential. This new solution enhances our already strong record in broadband on-wafer characterization, offering stable and repeatable results alongside safety features for setup. Such advancements help engineers boost productivity while maximizing performance."
Engineered for Ultimate Precision in Sub-THz Testing
The new 250 GHz solution features MPI's innovative single-ended TITAN™ T250MAK and differential T250MSK Probes. These probes are constructed utilizing a state-of-the-art 0.5 mm broadband coaxial interface, which is essential for effective broadband device characterization and high-speed differential testing. Several standout features of the probes include:
- Ultra-low insertion loss ensuring excellent performances across frequency ranges.
- Exceptional tip visibility and mechanical stability, facilitating accurate alignment and data consistency.
- Retractable tip protector for enhanced safety and ease of use.
- Availability in singular (GSG) and dual (GSGSG) configurations, optimized for a range of device types.
These advanced probes seamlessly integrate with MPI's various probe station platforms, allowing for temperature-controlled, wafer-level measurements with minimal user interference, ensuring top-notch repeatability.
Keysight’s Insight on the Collaboration
David Tanaka, Product Manager at Keysight, emphasized the vital role of MPI's continuous innovation in the realm of high-frequency wafer probing. He stated, "MPI's TITAN™ probes deliver the accuracy, consistency, and system integration necessary to fully harness the capabilities of our 250 GHz solution. This partnership addresses the growing need for precise testing at sub-terahertz frequencies."
Meeting the Evolving Demands of Semiconductor Innovators
As industries such as AI, 5G/6G, and high-velocity optical communications continue to advance rapidly, the tools for testing and measurement must evolve accordingly. MPI's 250 GHz broadband system stands at the forefront of this evolution by providing:
- Comprehensive calibrated single-sweep broadband S-parameter measurements up to 250 GHz.
- Support for modulated wideband and nonlinear measurements.
- Complete integration with leading test instrumentation, ensuring a seamless measurement chain.
The deployment of MPI's latest innovative solution is already underway in evaluation environments with key customers and partners. Demonstration systems are currently available at MPI facilities, showcasing its capabilities in real-world applications.
About MPI Corporation
Founded in 1995 and based in Hsinchu, Taiwan, MPI Corporation is recognized as a global leader in semiconductor test solutions, specializing in advanced device characterization and wafer-level testing. The Advanced Semiconductor Test (AST) Division excels in areas such as RF/mmWave probing, high-power device testing, Silicon Photonics (SiPh), and wafer-level reliability. With a legacy of innovations, including the TITAN™ RF Probe series and the TS/IFE platform family, MPI continues to deliver excellence in precision, reliability, and performance throughout the semiconductor testing landscape.
Frequently Asked Questions
What is the main feature of MPI's new 250 GHz solution?
The solution integrates TITAN™ Probes with advanced wafer-level expertise, ideal for high-frequency semiconductor testing.
Who does MPI Corporation collaborate with for this solution?
MPI collaborates with Keysight Technologies to enhance its offerings with leading instrumentation.
What types of tests can be conducted with the new probes?
The probes support broadband S-parameter characterization and high-speed differential testing.
Where can MPI's 250 GHz broadband systems be demonstrated?
Demonstration systems are available at MPI's facilities, and they will appear at future industry events.
When was MPI Corporation established?
MPI Corporation was founded in 1995, establishing itself as a leader in semiconductor test solutions.
