(Total Views: 162)
Posted On: 03/19/2021 10:59:30 AM
Post# of 23622
$GTCH seeking to develop a new EDA (Electronic Design Automation) technology to achieve IC’s better DFM (Design For Manufacturing) analysis.
As Integrated Circuits (IC) technology advances, manufacturing and complexity are constantly growing. Microchips are being scaled down to meet the never-ending increasing demand for more functionalities, lower power consumption, higher performance and lower cost, creating major design and manufacturing challenges. Especially with deep nanometer chips, manufacturing is facing massive challenges in terms of silicon manufacturability, and yield efficiency. Power-Performance-Area (PPA), performance and design power constraints are making turnaround schedules for manufacturers difficult to achieve. GBT commenced a research and development efforts to introduce an analytical system and method to address yield considerations to help produce IC designs with the goal of providing more yield efficient.
As Integrated Circuits (IC) technology advances, manufacturing and complexity are constantly growing. Microchips are being scaled down to meet the never-ending increasing demand for more functionalities, lower power consumption, higher performance and lower cost, creating major design and manufacturing challenges. Especially with deep nanometer chips, manufacturing is facing massive challenges in terms of silicon manufacturability, and yield efficiency. Power-Performance-Area (PPA), performance and design power constraints are making turnaround schedules for manufacturers difficult to achieve. GBT commenced a research and development efforts to introduce an analytical system and method to address yield considerations to help produce IC designs with the goal of providing more yield efficient.
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