Posted On: 03/10/2015 12:14:37 PM
Post# of 22465
Large area quantitative analysis of nanostructured thin-films
Rafal Sliz,*a Chibuzor Eneh,a Yuji Suzuki,b Jakub Czajkowski,a Tapio Fabritius,a Poopathy Kathirgamanathan,c Arokia Nathan,d Risto Myllylaa and Ghassan Jabboure
Show Affiliations
RSC Adv., 2015,5, 12409-12415
DOI: 10.1039/C4RA16018E
Received 09 Dec 2014, Accepted 09 Jan 2015
First published online 09 Jan 2015
1-D nanostructured thin-films exhibit, amongst other properties, unique mechanical, electrical, thermal, and optical properties. These depend strongly on several aspects, including size, dimension and density. A thorough characterization of a nanostructured film requires extensive time and is a great effort in terms of human resources. This article presents a facile implementation of an automatic quantitative method for the characterization of nanostructured thin-films using a SEM image-based automatic characterization solution to evaluate the size distribution and surface area (areal density) of assembled structures on a large scale. The implemented solution has been used to evaluate electrochemically deposited zinc oxide nanorod thin-films as well as additional inorganic thin-films . To validate the results, the proposed characterization method was compared with manual small-scale characterization methods.
http://pubs.rsc.org/en/Content/ArticleLanding...ivAbstract
Rafal Sliz,*a Chibuzor Eneh,a Yuji Suzuki,b Jakub Czajkowski,a Tapio Fabritius,a Poopathy Kathirgamanathan,c Arokia Nathan,d Risto Myllylaa and Ghassan Jabboure
Show Affiliations
RSC Adv., 2015,5, 12409-12415
DOI: 10.1039/C4RA16018E
Received 09 Dec 2014, Accepted 09 Jan 2015
First published online 09 Jan 2015
1-D nanostructured thin-films exhibit, amongst other properties, unique mechanical, electrical, thermal, and optical properties. These depend strongly on several aspects, including size, dimension and density. A thorough characterization of a nanostructured film requires extensive time and is a great effort in terms of human resources. This article presents a facile implementation of an automatic quantitative method for the characterization of nanostructured thin-films using a SEM image-based automatic characterization solution to evaluate the size distribution and surface area (areal density) of assembled structures on a large scale. The implemented solution has been used to evaluate electrochemically deposited zinc oxide nanorod thin-films as well as additional inorganic thin-films . To validate the results, the proposed characterization method was compared with manual small-scale characterization methods.
http://pubs.rsc.org/en/Content/ArticleLanding...ivAbstract
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