Advantest Introduces the KGD Test Cell for Power Semiconductor Testing
Advantest Corporation has recently unveiled an advanced solution targeted at improving die-level test yields important for power semiconductors. This cutting-edge KGD Test Cell is specifically designed for wide-bandgap (WBG) devices, which are gaining traction in various industries, particularly with the rise of electric vehicles.
The Importance of Wide-Bandgap Devices
Power semiconductors play a pivotal role in the transition towards more efficient technologies. As electric vehicles gain popularity, the demand for these components that can handle higher voltages while being compact continues to soar. WBG devices such as silicon carbide (SiC) and gallium nitride (GaN) stand out due to their superior efficiency compared to traditional silicon-based systems. However, testing these advanced devices comes with unique challenges, primarily due to their sensitivity to high voltage and current.
How the KGD Test Cell Works
The KGD Test Cell from Advantest integrates the CREA MT series power device testers with the new HA1100 die prober. This integration forms a comprehensive testing environment that significantly minimizes manufacturing costs. One of the standout features of this test cell is its proprietary probe card interface (PCI) technology, which mitigates risks of damage during testing. If any complications arise, the test cell allows for a thorough investigation, thereby reducing potential downtime and enhancing productivity.
Benefits of the New Testing Technology
With the HA1100 die prober, only die that have successfully passed tests are used in the assembly of power modules. This proactive approach helps ensure high quality, preventing defects from entering the production line and ultimately reducing losses associated with final testing of multi-die assembled modules.
Advantest's Commitment to Innovation
Kazuyuki Yamashita, an executive vice president at Advantest, expressed enthusiasm about this innovation. He emphasized that the new KGD Test Cell combines their advanced testers with proven handling technology to offer dynamic testing at the die level. This capability not only preserves the integrity of the testing process, but it also fosters customer confidence in the modules they assemble, solidifying Advantest's position in the semiconductor testing industry.
Future Outlook
Advantest is on track to release the HA1100 die prober globally in the not-so-distant future. Industry experts anticipate that this new technology will set a benchmark within the semiconductor testing sphere, especially as developers recognize the increasing importance of sustainable solutions in manufacturing.
About Advantest Corporation
Founded in 1954 in Tokyo, Advantest (JPX: 6857) has established itself as a frontrunner in manufacturing automatic test and measurement equipment. Their solutions cater to a variety of industries, including telecommunications, automotive technology, and artificial intelligence, among others. Advantest’s commitment to R&D ensures they are always on the cutting edge of emerging testing needs, offering innovative products that integrate seamlessly into advanced semiconductor production lines worldwide.
Contact Information
For those interested in learning more about Advantest and its offerings, their main office is located at:
3061 Zanker Road
San Jose, CA 95134, USA
Cassandra Koenig
cassandra.koenig@advantest.com
Frequently Asked Questions
What is the KGD Test Cell?
The KGD Test Cell is an integrated testing solution designed for wide-bandgap devices, improving die-level test yields for power semiconductors.
Why are wide-bandgap devices important?
These devices enable power semiconductors to be smaller, faster, and more efficient, crucial for applications like electric vehicles.
What technologies are integrated into the KGD Test Cell?
It combines the CREA MT series testers with the HA1100 die prober, utilizing proprietary probe card interface technology.
When will the HA1100 die prober be available?
It is expected to be released globally in the second quarter of 2025.
How does the KGD Test Cell improve efficiency?
It minimizes manufacturing costs, reduces downtime, and ensures that only passed dies are used, enhancing overall production quality.
